High-yield performance-efficient redundancy analysis for 2D memory
نویسندگان
چکیده
منابع مشابه
Built-in redundancy analysis for memory yield improvement
With the advance of VLSI technology, the capacity and density of memories is rapidly growing. The yield improvement and testing issues have become the most critical challenges for memory manufacturing. Conventionally, redundancies are applied so that the faulty cells can be repairable. Redundancy analysis using external memory testers is becoming inefficient as the chip density continues to gro...
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ژورنال
عنوان ژورنال: Science China Information Sciences
سال: 2011
ISSN: 1674-733X,1869-1919
DOI: 10.1007/s11432-011-4357-x